Ontology highlight
ABSTRACT:
SUBMITTER: Ohkubo M
PROVIDER: S-EPMC3496949 | biostudies-literature | 2012
REPOSITORIES: biostudies-literature
Ohkubo M M Shiki S S Ukibe M M Matsubayashi N N Kitajima Y Y Nagamachi S S
Scientific reports 20121114
Fluorescence-yield X-ray absorption fine structure (FY-XAFS) is extensively used for investigating atomic-scale local structures around specific elements in functional materials. However, conventional FY-XAFS instruments frequently cannot cover trace light elements, for example dopants in wide gap semiconductors, because of insufficient energy resolution of semiconductor X-ray detectors. Here we introduce a superconducting XAFS (SC-XAFS) apparatus to measure X-ray absorption near-edge structure ...[more]