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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip.

ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37.?+?q.

SUBMITTER: Chang JM 

PROVIDER: S-EPMC4029376 | biostudies-literature | 2013 Dec

REPOSITORIES: biostudies-literature

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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip.

Chang Joe-Ming JM   Chang Wei-Yu WY   Chen Fu-Rong FR   Tseng Fan-Gang FG  

Nanoscale research letters 20131207 1

A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si3N4) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured with  ...[more]

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