Ontology highlight
ABSTRACT:
SUBMITTER: Li R
PROVIDER: S-EPMC4625185 | biostudies-literature | 2015
REPOSITORIES: biostudies-literature
Li Rui R Ye Hongfei H Zhang Weisheng W Ma Guojun G Su Yewang Y
Scientific reports 20151029
Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement ...[more]