Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.
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ABSTRACT:
SUBMITTER: Phillips LJ
PROVIDER: S-EPMC4669473 | biostudies-literature | 2015 Dec
REPOSITORIES: biostudies-literature
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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.
Phillips Laurie J LJ Rashed Atef M AM Treharne Robert E RE Kay James J Yates Peter P Mitrovic Ivona Z IZ Weerakkody Ayendra A Hall Steve S Durose Ken K
Data in brief 20151106
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm. ...[more]
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