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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.


ABSTRACT: Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.

SUBMITTER: Phillips LJ 

PROVIDER: S-EPMC4669473 | biostudies-literature | 2015 Dec

REPOSITORIES: biostudies-literature

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Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.

Phillips Laurie J LJ   Rashed Atef M AM   Treharne Robert E RE   Kay James J   Yates Peter P   Mitrovic Ivona Z IZ   Weerakkody Ayendra A   Hall Steve S   Durose Ken K  

Data in brief 20151106


Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm. ...[more]

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