Ontology highlight
ABSTRACT:
SUBMITTER: Sun C
PROVIDER: S-EPMC4891715 | biostudies-literature | 2016 Jun
REPOSITORIES: biostudies-literature
Sun Ce C Paulauskas Tadas T Sen Fatih G FG Lian Guoda G Wang Jinguo J Buurma Christopher C Chan Maria K Y MK Klie Robert F RF Kim Moon J MJ
Scientific reports 20160603
Extended defects are of considerable importance in determining the electronic properties of semiconductors, especially in photovoltaics (PVs), due to their effects on electron-hole recombination. We employ model systems to study the effects of dislocations in CdTe by constructing grain boundaries using wafer bonding. Atomic-resolution scanning transmission electron microscopy (STEM) of a [1-10]/(110) 4.8° tilt grain boundary reveals that the interface is composed of three distinct types of Lomer ...[more]