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ABSTRACT:
SUBMITTER: Copuroglu M
PROVIDER: S-EPMC5007498 | biostudies-literature | 2016 Sep
REPOSITORIES: biostudies-literature
Copuroglu Mehmet M Caliskan Deniz D Sezen Hikmet H Ozbay Ekmel E Suzer Sefik S
Scientific reports 20160901
X-ray photoelectron spectroscopy (XPS) is used to follow some of the electrical properties of a segmented silicon photodetector, fabricated in a p-n-p configuration, during operation under various biasing configurations. Mapping of the binding energy position of Si2p reveals the shift in the position of the junctions with respect to the polarity of the DC bias applied. Use of squared and triangular shaped wave excitations, while recording XPS data, allows tapping different electrical properties ...[more]