Surface studies of solids using integral X-ray-induced photoemission yield.

ABSTRACT: X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detect

SUBMITTER: Stoupin S 

PROVIDER: S-EPMC5118721 | biostudies-literature | 2016 Nov

REPOSITORIES: biostudies-literature