Ontology highlight
ABSTRACT:
SUBMITTER: Sedlak SM
PROVIDER: S-EPMC5377352 | biostudies-literature | 2017 Apr
REPOSITORIES: biostudies-literature
Sedlak Steffen M SM Bruetzel Linda K LK Lipfert Jan J
Journal of applied crystallography 20170329 Pt 2
A new model is proposed for the measurement errors incurred in typical small-angle X-ray scattering (SAXS) experiments, which takes into account the setup geometry and physics of the measurement process. The model accurately captures the experimentally determined errors from a large range of synchrotron and in-house anode-based measurements. Its most general formulation gives for the variance of the buffer-subtracted SAXS intensity σ<sup>2</sup>(<i>q</i>) = [<i>I</i>(<i>q</i>) + const.]/(<i>kq</ ...[more]