Ontology highlight
ABSTRACT:
SUBMITTER: Duan L
PROVIDER: S-EPMC5425182 | biostudies-literature | 2017
REPOSITORIES: biostudies-literature
Duan Liming L Yang Shangpeng S Zhang Gui G Feng Fei F Gu Minghui M
PloS one 20170510 5
The correspondence of a stack of planar contours in ICT (industrial computed tomography)-based reverse engineering, a key step in surface reconstruction, is difficult when the contours or topology of the object are complex. Given the regularity of industrial parts and similarity of the inter-layer contours, a specialized shape-based inter-layer contours correspondence method for ICT-based reverse engineering was presented to solve the above problem based on the vectorized contours. In this paper ...[more]