Surface Characterization of Polymer Blends by XPS and ToF-SIMS.
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ABSTRACT:
SUBMITTER: Chan CM
PROVIDER: S-EPMC5509266 | biostudies-literature | 2016 Aug
REPOSITORIES: biostudies-literature
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Surface Characterization of Polymer Blends by XPS and ToF-SIMS.
Chan Chi Ming CM Weng Lu-Tao LT
Materials (Basel, Switzerland) 20160804 8
The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principl ...[more]
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