High-precision measurement of the X-ray Cu K? spectrum.

ABSTRACT: The structure of the X-ray emission lines of the Cu K? complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 eV to 8100 eV has been covered with a highly precise angular scale, and well-defined system efficiency, providing accurate wavelengths and relative intensities. This measurement updates the standard multi-Lorentzian-fit parameters from Härtwig, Hölzer, et al., and is in modest disagreement with their results for the wavelength of the K?1 line when compared via quadratic fitting of the peak top; the intensity ratio of K?1 to K?2 agrees within the combined error bounds. However, the position of the fitted top of K?1 is very sensitive to the fit parameters, so it is not believed to be a robust value to quote without further qualification. We also provide accurate intensity and wavelength information for the so-called K?3,4 "satellite" complex. Supplementary data is provided which gives the entire shape of the spectrum in this region, allowing it to be used directly in cases where simplified, multi-Lorentzian fits to it are not sufficiently accurate.

SUBMITTER: Mendenhall MH 

PROVIDER: S-EPMC5531297 | biostudies-literature | 2017 Jun

REPOSITORIES: biostudies-literature