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Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS2 transistor.


ABSTRACT: Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS2 channel and source drain electrodes. Vertical tunnelling of electrons therefore makes it possible to suppress the Schottky barriers and Fermi level pinning, leading to homogeneous gate-control of the channel chemical potential across the bandgap edges. The observed features of ambipolar pn to np diode, which can be reversibly gate tuned, paves the way for future logic applications and high performance switches based on atomically thin semiconducting channel.Van der Waals heterostructures of atomically thin materials hold promise for nanoelectronics. Here, the authors demonstrate a reverted stacking fabrication method for heterostructures and devise a vertical tunnel-contacted MoS2 transistor, enabling gate tunable rectification and reversible pn to np diode behaviour.

SUBMITTER: Li XX 

PROVIDER: S-EPMC5645421 | biostudies-literature | 2017 Oct

REPOSITORIES: biostudies-literature

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Gate-controlled reversible rectifying behaviour in tunnel contacted atomically-thin MoS<sub>2</sub> transistor.

Li Xiao-Xi XX   Fan Zhi-Qiang ZQ   Liu Pei-Zhi PZ   Chen Mao-Lin ML   Liu Xin X   Jia Chuan-Kun CK   Sun Dong-Ming DM   Jiang Xiang-Wei XW   Han Zheng Z   Bouchiat Vincent V   Guo Jun-Jie JJ   Chen Jian-Hao JH   Zhang Zhi-Dong ZD  

Nature communications 20171017 1


Atomically thin two-dimensional semiconducting materials integrated into van der Waals heterostructures have enabled architectures that hold great promise for next generation nanoelectronics. However, challenges still remain to enable their applications as compliant materials for integration in logic devices. Here, we devise a reverted stacking technique to intercalate a wrinkle-free boron nitride tunnel layer between MoS<sub>2</sub> channel and source drain electrodes. Vertical tunnelling of el  ...[more]

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