Ontology highlight
ABSTRACT:
SUBMITTER: Osborn W
PROVIDER: S-EPMC5720371 | biostudies-literature | 2018 Jan
REPOSITORIES: biostudies-literature
Osborn William W Friedman Lawrence H LH Vaudin Mark M
Ultramicroscopy 20170831 Pt A
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions of features on these devices are smaller than the interaction volume for backscattered electrons, EBSD patterns from 3D nanodevices will frequently be the superposition of patterns from multiple material regions simultaneously. The effect of this superposition on EBSD strain measurement is demonstrated, along with an approach to separate E ...[more]