Dataset Information

Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene.

ABSTRACT: We measured the Mueller matrix bidirectional reflectance distribution function (BRDF) of a sintered polytetrafluoroethylene (PTFE) sample over the scattering hemisphere for six incident angles (0°-75° in 15° steps) and for four wavelengths (351 nm, 532 nm, 633 nm, and 1064 nm). The data for each wavelength were fit to a phenomenological description for the Mueller matrix BRDF, which is an extension of the bidirectional surface scattering modes developed by Koenderink and van Doorn [J. Opt. Soc. Am. A.15, 2903 (1998)JOAOD60740-323210.1364/JOSAA.15.002903] for unpolarized BRDF. This description is designed to be complete, to obey the appropriate reciprocity conditions, and to provide a full description of the Mueller matrix BRDF as a function of incident and scattering directions for each wavelength. The description was further extended by linearizing the surface scattering mode coefficients with wavelength. This data set and its parameterization provides a comprehensive on-demand description of the reflectance properties for this commonly used diffuse reflectance reference material over a wide range of wavelengths.

SUBMITTER: Germer TA

PROVIDER: S-EPMC5849086 | biostudies-literature | 2017 Nov

REPOSITORIES: biostudies-literature

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Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene.

Germer Thomas A TA

Applied optics 20171101 33

We measured the Mueller matrix bidirectional reflectance distribution function (BRDF) of a sintered polytetrafluoroethylene (PTFE) sample over the scattering hemisphere for six incident angles (0°-75° in 15° steps) and for four wavelengths (351 nm, 532 nm, 633 nm, and 1064 nm). The data for each wavelength were fit to a phenomenological description for the Mueller matrix BRDF, which is an extension of the bidirectional surface scattering modes developed by Koenderink and van Doorn [J. Opt. Soc. ...[more]

PMID: 29216106

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Project description:Global downwelling plane irradiance is a necessary variable to normalize water-leaving radiance measurements, reducing the magnitude and spectral variabilities introduced by the incident light field. As a result, the normalized measurements, known as remote sensing reflectance, have higher correlation with the inherent optical properties of the water body and so to the composition of optically active water components. For in situ measurements, the global downwelling plane irradiance can be estimated from the exitant radiance of sintered polytetrafluoroethylene plaques or other diffuse reflectance standards. This allows use of a single spectrometer to measure all necessary variables to estimate the remote sensing reflectance, reducing cost in acquisition and maintenance of instrumentation. However, despite being in use for more than 30 years, the uncertainty associated with the method has been only partially evaluated. In this study, we use a suite of sky radiance distributions for 24 atmospheres and nine solar zenith angles in combination with full bidirectional reflectance distribution function determinations of white and gray plaques to evaluate the uncertainties. The isolated and interactive effects of bidirectional reflectance distribution, shadowing, and tilt error sources are evaluated. We find that under the best-performing geometries of each plaque, and with appropriate estimation functions, average standard uncertainty ranges from 1% to 6.5%. The simulated errors are found to explain both previous empirical uncertainty estimates and new data collected during this study. Those errors are of the same magnitude as uncertainties of plane irradiance sensors (e.g., cosine collectors) and overlap with uncertainty requirements for different uses of in situ data, which supports the continued use of the plaque method in hydrologic optics research and monitoring. Recommendations are provided to improve the quality of measurements and assure that uncertainties will be in the range of those calculated here.

Dataset Information

Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene.

Publications

Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene.

Similar Datasets

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