Angular flux creep contributions in YBa2Cu3O7-δ nanocomposites from electrical transport measurements.

ABSTRACT: The shape of the electric-field-current-density (E-J) curve is determined by flux pinning and also by dynamics of vortices. Here, we propose a novel methodology to study the normalized flux creep rate S in YBa2Cu3O7-δ measured from E-J curves obtained by electrical transport measurements that provides a fast and versatile way to foresee the flux magnetic relaxation in films and disentangle angular flux creep contributions by the scaling of the isotropic contribution of S. After a detailed comparison of various pristine and nanocomposite films with differentiated nanostructures, we focus on the roles that intrinsic pinning and stacking faults (YBa2Cu4O8-intergrowths) play when the magnetic field is applied parallel to the superconducting CuO2 planes. This study reveals that the emerging int

SUBMITTER: Valles F 

PROVIDER: S-EPMC5897461 | biostudies-literature | 2018 Apr

REPOSITORIES: biostudies-literature