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Structural and morphological data of RF-Sputtered BiVO4 thin films.


ABSTRACT: Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1?h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.

SUBMITTER: Venkatesan R 

PROVIDER: S-EPMC5988375 | biostudies-literature | 2018 Apr

REPOSITORIES: biostudies-literature

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Structural and morphological data of RF-Sputtered BiVO<sub>4</sub> thin films.

Venkatesan R R   Velumani S S   Ordon K K   Makowska-Janusik M M   Corbel G G   Kassiba A A  

Data in brief 20180202


Structural and morphological modulation of rf-sputtered BiVO<sub>4</sub> thin films deposited using mechanochemical synthesis prepared BiVO<sub>4</sub> nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1 h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film o  ...[more]

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