Short range biaxial strain relief mechanism within epitaxially grown BiFeO₃.

ABSTRACT: Lattice mismatch-induced biaxial strain effect on the crystal structure and growth mechanism is investigated for the BiFeO₃ films grown on La_0.6Sr_0.4MnO₃/SrTiO₃ and YAlO₃ substrates. Nano-beam electron diffraction, structure factor calculation and x-ray reciprocal space mapping unambiguously confirm that the crystal structure within both of the BiFeO₃ thin films is rhombohedral by showing the rhombohedral signature Bragg's reflections. Further investigation with atomic resolution scanning transmission electron microscopy reveals that while the ~1.0% of the lattice mismatch found in the BiFeO₃ grown on La_0.6Sr_0.4MnO₃/SrTiO₃ is exerted as biaxial in-plane compre

SUBMITTER: Bae IT 

PROVIDER: S-EPMC6491549 | biostudies-literature | 2019 Apr

REPOSITORIES: biostudies-literature