Ontology highlight
ABSTRACT:
SUBMITTER: Okuma G
PROVIDER: S-EPMC6690982 | biostudies-literature | 2019 Aug
REPOSITORIES: biostudies-literature
Okuma Gaku G Watanabe Shuhei S Shinobe Kan K Nishiyama Norimasa N Takeuchi Akihisa A Uesugi Kentaro K Tanaka Satoshi S Wakai Fumihiro F
Scientific reports 20190812 1
The characterization of the processing-induced defects is an essential step for developing defect-free processing, which is important to the assurance of structural reliability of brittle ceramics. The multiscale X-ray computed tomography, consisting of micro-CT as a wide-field and low-resolution system and nano-CT as a narrow-field and high-resolution system, is suitable for observing crack-like defects with small length and with very small crack opening displacement. Here we applied this power ...[more]