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Origin of Fresnel problem of two dimensional materials.


ABSTRACT: Reflectance, transmittance, and absorption of materials are also known as materials' Fresnel problem. It is widely accepted that Interface model can be utilized to solve Fresnel problem of two dimensional materials. Here, we question the validity of Interface model. Theoretical and experimental results of two dimensional materials are analyzed, and theoretical optical response of two dimensional materials is derived based on thin film model. A new simple, approximate formula of 4?nkd/? is proposed for calculation of absorption of two dimensional materials. It is found that, in essence, Interface model is a kind of approximate style of thin film model, the main difference between two models is term of (n2?-?k2) at normal incidence. A significant error is introduced into reflectance calculation of two dimensional materials when Interface model is utilized. Thus, it is not correct to use Interface model to solve Fresnel problem of two dimensional materials. Thin film model rather than Interface model can be used to universally solve Fresnel problem of two dimensional materials, and exhibit a better agreement with experimental reflectance results than Interface model. Unexpectedly, on contrary to other remarkable, intriguing properties, two dimensional materials exhibit an ordinary Fresnel optical response, which is same with thin film.

SUBMITTER: Wang X 

PROVIDER: S-EPMC6882841 | biostudies-literature | 2019 Nov

REPOSITORIES: biostudies-literature

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Origin of Fresnel problem of two dimensional materials.

Wang Xiaodong X   Chen Bo B  

Scientific reports 20191128 1


Reflectance, transmittance, and absorption of materials are also known as materials' Fresnel problem. It is widely accepted that Interface model can be utilized to solve Fresnel problem of two dimensional materials. Here, we question the validity of Interface model. Theoretical and experimental results of two dimensional materials are analyzed, and theoretical optical response of two dimensional materials is derived based on thin film model. A new simple, approximate formula of 4πnkd/λ is propos  ...[more]

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