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Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations.


ABSTRACT: During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.

SUBMITTER: Gustafson S 

PROVIDER: S-EPMC7314802 | biostudies-literature | 2020 Jun

REPOSITORIES: biostudies-literature

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Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations.

Gustafson Sven S   Ludwig Wolfgang W   Shade Paul P   Naragani Diwakar D   Pagan Darren D   Cook Phil P   Yildirim Can C   Detlefs Carsten C   Sangid Michael D MD  

Nature communications 20200624 1


During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark  ...[more]

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