Energy-dispersive X-ray spectroscopy and atom-probe tomography data quantifying component-ratios of multicomponent nano-precipitates in ion-irradiated ceria.

ABSTRACT: Samples of ∼1 µm films of CeO₂ doped with 2 wt% Mo, 1.5 wt% Ru, 0.75 wt% Pd, 0.5 wt% Re and 0.25 wt% Rh grown with pulsed laser deposition were irradiated with I²⁺ ions (610 °C and 730 °C, 10¹⁶ and 5 × 10¹⁶ I²⁺/cm²). For selected samples post-irradiation heat treatment was conducted (900 °C, 1100 °C). The specimens were sectioned with focused ion beam milling and characterized in a transmission electron microscope with energy-dispersive x-ray spectroscopy, and with atom-probe tomography. Energy-dispersive x-ray spectroscopy was used to obtain elemental maps showing the distribution of dopants in the specimen after exposure. Some of these maps are discussed in detail in our companion article "Formation of multicomponent alloy

SUBMITTER: Kruska K 

PROVIDER: S-EPMC8607157 | biostudies-literature | 2021 Dec

REPOSITORIES: biostudies-literature