Ontology highlight
ABSTRACT:
SUBMITTER: Buchnev O
PROVIDER: S-EPMC9097578 | biostudies-literature | 2022 Apr
REPOSITORIES: biostudies-literature
Buchnev Oleksandr O Grant-Jacob James A JA Eason Robert W RW Zheludev Nikolay I NI Mills Ben B MacDonald Kevin F KF
Nano letters 20220324 7
Focused ion beam (FIB) milling is an important rapid prototyping tool for micro- and nanofabrication and device and materials characterization. It allows for the manufacturing of arbitrary structures in a wide variety of materials, but establishing the process parameters for a given task is a multidimensional optimization challenge, usually addressed through time-consuming, iterative trial-and-error. Here, we show that deep learning from prior experience of manufacturing can predict the postfabr ...[more]