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ABSTRACT:
SUBMITTER: Petit A
PROVIDER: S-EPMC9348878 | biostudies-literature | 2022 Aug
REPOSITORIES: biostudies-literature
Petit Antoine A Pokam Sylvia S Mazen Frederic F Tardif Samuel S Landru Didier D Kononchuk Oleg O Ben Mohamed Nadia N Olbinado Margie P MP Rack Alexander A Rieutord Francois F
Journal of applied crystallography 20220730 Pt 4
<i>In situ</i> investigations of cracks propagating at up to 2.5 km s<sup>-1</sup> along an (001) plane of a silicon single crystal are reported, using X-ray diffraction megahertz imaging with intense and time-structured synchrotron radiation. The studied system is based on the Smart Cut process, where a buried layer in a material (typically Si) is weakened by microcracks and then used to drive a macroscopic crack (10<sup>-1</sup> m) in a plane parallel to the surface with minimal deviation (10< ...[more]