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Ultra-high voltage electron microscope tomography tilt series of 0.7-μm-thick neurite section acquired at 6,000× magnification at an accelerating voltage of 1 MV

ABSTRACT:

SUBMITTER: Nishida Tomoki

PROVIDER: EMPIAR-10354 | biostudies-other |

REPOSITORIES: biostudies-other

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Publications

Application of ultra-high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells.

Nishida T T Yoshimura R R Nishi R R Imoto Y Y Endo Y Y

Journal of microscopy 20200318 1

Electron tomography methods using the conventional transmission electron microscope have been widely used to investigate the three-dimensional distribution patterns of various cellular structures including microtubules in neurites. Because the penetrating power of electrons depends on the section thickness and accelerating voltage, conventional TEM, having acceleration voltages up to 200 kV, is limited to sample thicknesses of 0.2 µm or less. In this paper, we show that the ultra-high voltage el ...[more]

PMID: 32133640

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