High speed atomic force microscopy enabled by a sample profile estimator.

ABSTRACT: In this paper, an estimation scheme for imaging in Atomic Force Microscopy (AFM) is presented which yields imaging rates well beyond the bandwidth of the vertical positioner and allows for high-speed AFM on a typical commercial instrument. The estimator can be applied to existing instruments with little to no hardware modification other than that needed to sample the cantilever signal. Experiments on a calibration sample as well as lambda DNA are performed to illustrate the effectiveness of this method. These show a greater than an order-of-magnitude improvement in the imaging rate.

SUBMITTER: Huang P 

PROVIDER: S-EPMC3683030 | biostudies-other | 2013 May

REPOSITORIES: biostudies-other