Ontology highlight
ABSTRACT:
SUBMITTER: Veligura V
PROVIDER: S-EPMC3740815 | biostudies-other | 2013
REPOSITORIES: biostudies-other
Veligura Vasilisa V Hlawacek Gregor G Berkelaar Robin P RP van Gastel Raoul R Zandvliet Harold J W HJ Poelsema Bene B
Beilstein journal of nanotechnology 20130724
Helium ion microscopy (HIM) was used to investigate the interaction of a focused He(+) ion beam with energies of several tens of kiloelectronvolts with metals. HIM is usually applied for the visualization of materials with extreme surface sensitivity and resolution. However, the use of high ion fluences can lead to significant sample modifications. We have characterized the changes caused by a focused He(+) ion beam at normal incidence to the Au{111} surface as a function of ion fluence and ener ...[more]