Contact-free scanning and imaging with the scanning ion conductance microscope.

ABSTRACT: Scanning ion conductance microscopy (SICM) offers the ability to obtain very high-resolution topographical images of living cells. One of the great advantages of SICM lies in its ability to perform contact-free scanning. However, it is not yet clear when the requirements for this scan mode are met. We have used finite element modeling (FEM) to examine the conditions for contact-free scanning. Our findings provide a framework for understanding the contact-free mode of SICM and also extend previous findings with regard to SICM resolution. Finally, we demonstrate the importance of our findings for accurate biological imaging.

SUBMITTER: Del Linz S 

PROVIDER: S-EPMC3944807 | biostudies-other | 2014 Mar

REPOSITORIES: biostudies-other