Ontology highlight
ABSTRACT:
SUBMITTER: Gao S
PROVIDER: S-EPMC5537274 | biostudies-other | 2017 Jul
REPOSITORIES: biostudies-other
Gao Si S Wang Peng P Zhang Fucai F Martinez Gerardo T GT Nellist Peter D PD Pan Xiaoqing X Kirkland Angus I AI
Nature communications 20170731 1
Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corre ...[more]