Ontology highlight
ABSTRACT:
SUBMITTER: Patel M
PROVIDER: S-EPMC5545874 | biostudies-other | 2017 Oct
REPOSITORIES: biostudies-other
Patel Malkeshkumar M Kim Hong-Sik HS Kim Joondong J
Data in brief 20170726
In this data article, vertically grown SnS layers were investigated. The growth processes of vertical SnS layers were discussed in our article [1]. This data article provides the chemical analysis using the XPS measurements for the SnS sample grown on a Si wafer. Deposition time varying SnS morphology changes were observed by FESEM. The cross-sectional images were achieved to monitor the SnS layer thickness. Refractive index of the grown SnS film was calculated using the reflectance data. A self ...[more]