Ontology highlight
ABSTRACT:
SUBMITTER: Naresh-Kumar G
PROVIDER: S-EPMC5589861 | biostudies-other | 2017 Sep
REPOSITORIES: biostudies-other
Naresh-Kumar G G Vilalta-Clemente A A Jussila H H Winkelmann A A Nolze G G Vespucci S S Nagarajan S S Wilkinson A J AJ Trager-Cowan C C
Scientific reports 20170907 1
Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter diffraction (EBSD) technique in a scanning electron microscope to non-destructively characterise and quantify antiphase domains (APDs) in GaP thin films grown on different (001) Si substrates with di ...[more]