Ontology highlight
ABSTRACT:
SUBMITTER: Li Z
PROVIDER: S-EPMC5762822 | biostudies-other | 2018 Jan
REPOSITORIES: biostudies-other
Li Zuo Z Sotto Moïse M Liu Fayong F Husain Muhammad Khaled MK Yoshimoto Hiroyuki H Sasago Yoshitaka Y Hisamoto Digh D Tomita Isao I Tsuchiya Yoshishige Y Saito Shinichi S
Scientific reports 20180110 1
The Random Telegraph Noise (RTN) in an advanced Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is considered to be triggered by just one electron or one hole, and its importance is recognised upon the aggressive scaling. However, the detailed nature of the charge trap remains to be investigated due to the difficulty to find out the exact device, which shows the RTN feature over statistical variations. Here, we show the RTN can be observed from virtually all devices at low temperature ...[more]