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Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction.


ABSTRACT: Deformation mechanisms of cold drawn and electropolished nickel microwires are studied by performing in-situ monotonous and cyclic tensile tests under synchrotron radiation. X-ray diffraction tests allow probing elastic strains in the different grain families and establishing a link with the deformation mechanisms taking place within the microwires. The measurements were carried out on several microwires with diameters ranging from as-drawn 100?µm down to 40?µm thinned down by electropolishing. The as-drawn wires exhibit a core-shell microstructure with <111> fiber texture dominant in core and heterogeneous dual fiber texture <111> and <100> in the shell. Reduction of specimen size by electropolishing results in a higher yield stress and tensile strength along with reduced ductility. In-situ XRD analysis revealed that these differences are linked to the global variation in microstructure induced by shell removal with electropolishing, which in turn affects the load sharing abilities of grain families. This study thus proposes a new way to increase ductility and retain strength in nickel microwires across different diameters by tuning the microstructure architecture.

SUBMITTER: Purushottam Raj Purohit RRP 

PROVIDER: S-EPMC6329826 | biostudies-other | 2019 Jan

REPOSITORIES: biostudies-other

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Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction.

Purushottam Raj Purohit Ravi Raj Purohit RRP   Arya Abhinav A   Bojjawar Girish G   Pelerin Maxime M   Van Petegem Steven S   Proudhon Henry H   Mukherjee Soham S   Gerard Céline C   Signor Loïc L   Mocuta Cristian C   Casati Nicola N   Suwas Satyam S   Chokshi Atul H AH   Thilly Ludovic L  

Scientific reports 20190111 1


Deformation mechanisms of cold drawn and electropolished nickel microwires are studied by performing in-situ monotonous and cyclic tensile tests under synchrotron radiation. X-ray diffraction tests allow probing elastic strains in the different grain families and establishing a link with the deformation mechanisms taking place within the microwires. The measurements were carried out on several microwires with diameters ranging from as-drawn 100 µm down to 40 µm thinned down by electropolishing.  ...[more]

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