Manipulation of the electrical and memory properties of MoS2 field-effect transistors by highly charged ion irradiation† † Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d3na00543g
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SUBMITTER: Sleziona S
PROVIDER: S-EPMC10696994 | biostudies-literature | 2023 Nov
REPOSITORIES: biostudies-literature
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