Ontology highlight
ABSTRACT:
SUBMITTER: Zhu J
PROVIDER: S-EPMC2808506 | biostudies-literature | 2009 Mar-Apr
REPOSITORIES: biostudies-literature
Zhu Jie J Sabharwal Tanya T Guo Lianhong L Kalyanasundaram Aruna A Wang Guodong G
Scanning 20090301 2
Proper sample preparation, scan setup, data collection and image analysis are key factors in successful atomic force microscopy (AFM), which can avoid gloss phenomena effectively from unreasonable manipulations or instrumental defaults. Fresh cleaved mica and newly treated glass cover were checked first as the substrates for all of the sample preparation for AFM. Then, crystals contamination from buffer was studied separately or combined with several biologic samples, and the influence of scanne ...[more]