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11 nm hard X-ray focus from a large-aperture multilayer Laue lens.

ABSTRACT: The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies.

SUBMITTER: Huang X

PROVIDER: S-EPMC3868962 | biostudies-literature | 2013 Dec

REPOSITORIES: biostudies-literature

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11 nm hard X-ray focus from a large-aperture multilayer Laue lens.

Huang Xiaojing X Yan Hanfei H Nazaretski Evgeny E Conley Raymond R Bouet Nathalie N Zhou Juan J Lauer Kenneth K Li Li L Eom Daejin D Legnini Daniel D Harder Ross R Robinson Ian K IK Chu Yong S YS

Scientific reports 20131220

The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while off ...[more]

PMID: 24356395

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