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Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging.


ABSTRACT: Total internal reflection fluorescence microscopy (TIRFM) is the method of choice to visualize a variety of cellular processes in particular events localized near the plasma membrane of live adherent cells. This imaging technique not relying on particular fluorescent probes provides a high sectioning capability. It is, however, restricted to a single plane. We present here a method based on a versatile design enabling fast multiwavelength azimuthal averaging and incidence angles scanning to computationally reconstruct 3D images sequences. We achieve unprecedented 50-nm axial resolution over a range of 800 nm above the coverslip. We apply this imaging modality to obtain structural and dynamical information about 3D actin architectures. We also temporally decipher distinct Rab11a-dependent exocytosis events in 3D at a rate of seven stacks per second.

SUBMITTER: Boulanger J 

PROVIDER: S-EPMC4260613 | biostudies-literature | 2014 Dec

REPOSITORIES: biostudies-literature

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Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging.

Boulanger Jérôme J   Gueudry Charles C   Münch Daniel D   Cinquin Bertrand B   Paul-Gilloteaux Perrine P   Bardin Sabine S   Guérin Christophe C   Senger Fabrice F   Blanchoin Laurent L   Salamero Jean J  

Proceedings of the National Academy of Sciences of the United States of America 20141117 48


Total internal reflection fluorescence microscopy (TIRFM) is the method of choice to visualize a variety of cellular processes in particular events localized near the plasma membrane of live adherent cells. This imaging technique not relying on particular fluorescent probes provides a high sectioning capability. It is, however, restricted to a single plane. We present here a method based on a versatile design enabling fast multiwavelength azimuthal averaging and incidence angles scanning to comp  ...[more]

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