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Enhanced quantification for 3D SEM-EDS: using the full set of available X-ray lines.

ABSTRACT: An enhanced method to quantify energy dispersive spectra recorded in 3D with a scanning electron microscope (3D SEM-EDS) has been previously demonstrated. This paper presents an extension of this method using all the available X-ray lines generated by the beam. The extended method benefits from using high energy lines, that are more accurately quantified, and from using soft X-rays that are highly absorbed and thus more surface sensitive. The data used to assess the method are acquired with a dual beam FIB/SEM investigating a multi-element Ni-based superalloy. A high accelerating voltage, needed to excite the highest energy X-ray line, results in two available X-ray lines for several elements. The method shows an improved compositional quantification as well as an improved spatial resolution.

SUBMITTER: Burdet P

PROVIDER: S-EPMC4266451 | biostudies-literature | 2015 Jan

REPOSITORIES: biostudies-literature

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Enhanced quantification for 3D SEM-EDS: using the full set of available X-ray lines.

Burdet Pierre P Croxall S A SA Midgley P A PA

Ultramicroscopy 20141029

An enhanced method to quantify energy dispersive spectra recorded in 3D with a scanning electron microscope (3D SEM-EDS) has been previously demonstrated. This paper presents an extension of this method using all the available X-ray lines generated by the beam. The extended method benefits from using high energy lines, that are more accurately quantified, and from using soft X-rays that are highly absorbed and thus more surface sensitive. The data used to assess the method are acquired with a du ...[more]

PMID: 25461593

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