Ontology highlight
ABSTRACT:
SUBMITTER: Zheng S
PROVIDER: S-EPMC4614025 | biostudies-literature | 2015
REPOSITORIES: biostudies-literature
Zheng Shijian S Shao Shuai S Zhang Jian J Wang Yongqiang Y Demkowicz Michael J MJ Beyerlein Irene J IJ Mara Nathan A NA
Scientific reports 20151021
Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an interesting phenomenon in their interaction, wherein voids adhere to only one side of the bimetal interfaces rather than overlapping them. We show that this asymmetrical void-interface interaction is a co ...[more]