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Mobility overestimation due to gated contacts in organic field-effect transistors.


ABSTRACT: Parameters used to describe the electrical properties of organic field-effect transistors, such as mobility and threshold voltage, are commonly extracted from measured current-voltage characteristics and interpreted by using the classical metal oxide-semiconductor field-effect transistor model. However, in recent reports of devices with ultra-high mobility (>40 cm(2) V(-1) s(-1)), the device characteristics deviate from this idealized model and show an abrupt turn-on in the drain current when measured as a function of gate voltage. In order to investigate this phenomenon, here we report on single crystal rubrene transistors intentionally fabricated to exhibit an abrupt turn-on. We disentangle the channel properties from the contact resistance by using impedance spectroscopy and show that the current in such devices is governed by a gate bias dependence of the contact resistance. As a result, extracted mobility values from d.c. current-voltage characterization are overestimated by one order of magnitude or more.

SUBMITTER: Bittle EG 

PROVIDER: S-EPMC4792947 | biostudies-literature | 2016 Mar

REPOSITORIES: biostudies-literature

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Mobility overestimation due to gated contacts in organic field-effect transistors.

Bittle Emily G EG   Basham James I JI   Jackson Thomas N TN   Jurchescu Oana D OD   Gundlach David J DJ  

Nature communications 20160310


Parameters used to describe the electrical properties of organic field-effect transistors, such as mobility and threshold voltage, are commonly extracted from measured current-voltage characteristics and interpreted by using the classical metal oxide-semiconductor field-effect transistor model. However, in recent reports of devices with ultra-high mobility (>40 cm(2) V(-1) s(-1)), the device characteristics deviate from this idealized model and show an abrupt turn-on in the drain current when me  ...[more]

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