Ontology highlight
ABSTRACT:
SUBMITTER: Lin SK
PROVIDER: S-EPMC5465215 | biostudies-literature | 2017 Jun
REPOSITORIES: biostudies-literature
Lin Shih-Kang SK Liu Yu-Chen YC Chiu Shang-Jui SJ Liu Yen-Ting YT Lee Hsin-Yi HY
Scientific reports 20170608 1
The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here, we performed in situ current-stressing experiments for pure Cu strips using synchrotron X-ray diffractometry and scanning electron microscopy and ab initio calculations based on density functional theory. An ...[more]