Ontology highlight
ABSTRACT:
SUBMITTER: Ievlev AV
PROVIDER: S-EPMC5719033 | biostudies-literature | 2017 Dec
REPOSITORIES: biostudies-literature
Ievlev Anton V AV Belianinov Alexei A Jesse Stephen S Allison David P DP Doktycz Mitchel J MJ Retterer Scott T ST Kalinin Sergei V SV Ovchinnikova Olga S OS
Scientific reports 20171206 1
Time of flight secondary ion mass spectrometry (ToF-SIMS) is a powerful surface-sensitive characterization tool allowing the imaging of chemical properties over a wide range of organic and inorganic material systems. This technique allows precise studies of chemical composition with sub-100-nm lateral and nanometer depth spatial resolution. However, comprehensive interpretation of ToF-SIMS results is challenging because of the very large data volume and high dimensionality. Furthermore, investig ...[more]