Ontology highlight
ABSTRACT:
SUBMITTER: Ranjan A
PROVIDER: S-EPMC5809508 | biostudies-literature | 2018 Feb
REPOSITORIES: biostudies-literature
Scientific reports 20180212 1
This study investigates the resistive switching characteristics and underlying mechanism in 2D layered hexagonal boron nitride (h-BN) dielectric films using conductive atomic force microscopy. A combination of bipolar and threshold resistive switching is observed consistently on multi-layer h-BN/Cu stacks in the low power regime with current compliance (I <sub>comp</sub> ) of less than 100 nA. Standard random telegraph noise signatures were observed in the low resistance state (LRS), similar to ...[more]