Ontology highlight
ABSTRACT:
SUBMITTER: Wang Y
PROVIDER: S-EPMC5870145 | biostudies-literature | 2018
REPOSITORIES: biostudies-literature
Wang Ying Y Shen Yue Y Wang Xingya X Shen Zhiwei Z Li Bin B Hu Jun J Zhang Yi Y
Beilstein journal of nanotechnology 20180316
The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. ...[more]