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Accurate and efficient data acquisition methods for high-resolution angle-resolved photoemission microscopy.


ABSTRACT: Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental technique in materials science, as it can directly probe electronic states inside solids in energy (E) and momentum (k) space. As an advanced technique, spatially-resolved ARPES using a well-focused light source (high-resolution ARPES microscopy) has recently attracted growing interests because of its capability to obtain local electronic information at micro- or nano-metric length scales. However, there exist several technical challenges to guarantee high precision in determining translational and rotational positions in reasonable measurement time. Here we present two methods of obtaining k-space mapping and real-space imaging in high-resolution ARPES microscopy. One method is for k-space mapping measurements that enables us to keep a target position on a sample surface during sample rotation by compensating rotation-induced displacements (tracing acquisition method). Another method is for real-space imaging measurements that significantly reduces total acquisition time (scanning acquisition method). We provide several examples of these methods that clearly indicate higher accuracy in k-space mapping as well as higher efficiency in real-space imaging, and thus improved throughput of high-resolution APRES microscopy.

SUBMITTER: Iwasawa H 

PROVIDER: S-EPMC6258666 | biostudies-literature | 2018 Nov

REPOSITORIES: biostudies-literature

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Accurate and efficient data acquisition methods for high-resolution angle-resolved photoemission microscopy.

Iwasawa Hideaki H   Takita Hitoshi H   Goto Kazuki K   Mansuer Wumiti W   Miyashita Takeo T   Schwier Eike F EF   Ino Akihiro A   Shimada Kenya K   Aiura Yoshihiro Y  

Scientific reports 20181127 1


Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental technique in materials science, as it can directly probe electronic states inside solids in energy (E) and momentum (k) space. As an advanced technique, spatially-resolved ARPES using a well-focused light source (high-resolution ARPES microscopy) has recently attracted growing interests because of its capability to obtain local electronic information at micro- or nano-metric length scales. However, there exist several t  ...[more]

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