Ontology highlight
ABSTRACT:
SUBMITTER: Lu Y
PROVIDER: S-EPMC6529430 | biostudies-literature | 2019 May
REPOSITORIES: biostudies-literature
Scientific reports 20190521 1
In situ measurement of residual stress is a challenge, and it is a source of many defects during additive manufacturing (AM). Usually, postmortem measurement is too late to save the product once a defect appears. Most of the existing technologies are predictive simulations and postmortem analysis. However, these technologies cannot directly reflect the stress evolution during the fabrication process. This paper introduces a computer vision-based stress monitoring system combined with finite elem ...[more]