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Simulation of Inference Accuracy Using Realistic RRAM Devices.


ABSTRACT: Resistive Random Access Memory (RRAM) is a promising technology for power efficient hardware in applications of artificial intelligence (AI) and machine learning (ML) implemented in non-von Neumann architectures. However, there is an unanswered question if the device non-idealities preclude the use of RRAM devices in this potentially disruptive technology. Here we investigate the question for the case of inference. Using experimental results from silicon oxide (SiO x ) RRAM devices, that we use as proxies for physical weights, we demonstrate that acceptable accuracies in classification of handwritten digits (MNIST data set) can be achieved using non-ideal devices. We find that, for this test, the ratio of the high- and low-resistance device states is a crucial determinant of classification accuracy, with ~96.8% accuracy achievable for ratios >3, compared to ~97.3% accuracy achieved with ideal weights. Further, we investigate the effects of a finite number of discrete resistance states, sub-100% device yield, devices stuck at one of the resistance states, current/voltage non-linearities, programming non-linearities and device-to-device variability. Detailed analysis of the effects of the non-idealities will better inform the need for the optimization of particular device properties.

SUBMITTER: Mehonic A 

PROVIDER: S-EPMC6582938 | biostudies-literature | 2019

REPOSITORIES: biostudies-literature

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Simulation of Inference Accuracy Using Realistic RRAM Devices.

Mehonic Adnan A   Joksas Dovydas D   Ng Wing H WH   Buckwell Mark M   Kenyon Anthony J AJ  

Frontiers in neuroscience 20190612


Resistive Random Access Memory (RRAM) is a promising technology for power efficient hardware in applications of artificial intelligence (AI) and machine learning (ML) implemented in non-von Neumann architectures. However, there is an unanswered question if the device non-idealities preclude the use of RRAM devices in this potentially disruptive technology. Here we investigate the question for the case of inference. Using experimental results from silicon oxide (SiO <sub><i>x</i></sub> ) RRAM dev  ...[more]

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