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Negative Capacitance as Universal Digital and Analog Performance Booster for Complementary MOS Transistors.


ABSTRACT: Boltzmann electron energy distribution poses a fundamental limit to lowering the energy dissipation of conventional MOS devices, a minimum increase of the gate voltage, i.e. 60?mV, is required for a 10-fold increase in drain-to-source current at 300?K. Negative Capacitance (NC) in ferroelectric materials is proposed in order to address this physical limitation of CMOS technology. A polarization destabilization in ferroelectrics causes an effective negative permittivity, resulting in a differential voltage amplification and a reduced subthreshold swing when integrated into the gate stack of a transistor. The novelty and universality of this approach relate to the fact that the gate stack is not anymore a passive part of the transistor and contributes to signal amplification. In this paper, we experimentally validate NC as a universal performance booster: (i) for complementary MOSFETs, of both n- and p-type in an advanced CMOS technology node, and, (ii) for both digital and analog significant enhancements of key figures of merit for information processing (subthreshold swing, overdrive, and current efficiency factor). Accordingly, a sub-thermal swing down to 10?mV/decade together with an enhanced current efficiency factor up to 105 V-1 is obtained in both n- and p-type MOSFETs at room temperature by exploiting a PZT capacitor as the NC booster. As a result of the subthreshold swing reduction and overdrive improvement observed by NC, the required supply voltage to provide the same on-current is reduced by approximately 50%.

SUBMITTER: Saeidi A 

PROVIDER: S-EPMC6591349 | biostudies-literature | 2019 Jun

REPOSITORIES: biostudies-literature

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Negative Capacitance as Universal Digital and Analog Performance Booster for Complementary MOS Transistors.

Saeidi Ali A   Jazaeri Farzan F   Stolichnov Igor I   Enz Christian C CC   Ionescu Adrian M AM  

Scientific reports 20190624 1


Boltzmann electron energy distribution poses a fundamental limit to lowering the energy dissipation of conventional MOS devices, a minimum increase of the gate voltage, i.e. 60 mV, is required for a 10-fold increase in drain-to-source current at 300 K. Negative Capacitance (NC) in ferroelectric materials is proposed in order to address this physical limitation of CMOS technology. A polarization destabilization in ferroelectrics causes an effective negative permittivity, resulting in a differenti  ...[more]

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