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Twist Angle mapping in layered WS2 by Polarization-Resolved Second Harmonic Generation.

ABSTRACT: Stacked atomically thin transition metal dichalcogenides (TMDs) exhibit fundamentally new physical properties compared to those of the individual layers. The twist angle between the layers plays a crucial role in tuning these properties. Having a tool that provides high-resolution, large area mapping of the twist angle, would be of great importance in the characterization of such 2D structures. Here we use polarization-resolved second harmonic generation (P-SHG) imaging microscopy to rapidly map the twist angle in large areas of overlapping WS2 stacked layers. The robustness of our methodology lies in the combination of both intensity and polarization measurements of SHG in the overlapping region. This allows the accurate measurement and consequent pixel-by-pixel mapping of the twist angle in this area. For the specific case of 30° twist angle, P-SHG enables imaging of individual layers.

SUBMITTER: Psilodimitrakopoulos S 

PROVIDER: S-EPMC6776617 | biostudies-literature | 2019 Oct

REPOSITORIES: biostudies-literature

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Twist Angle mapping in layered WS<sub>2</sub> by Polarization-Resolved Second Harmonic Generation.

Psilodimitrakopoulos Sotiris S   Mouchliadis Leonidas L   Paradisanos Ioannis I   Kourmoulakis George G   Lemonis Andreas A   Kioseoglou George G   Stratakis Emmanuel E  

Scientific reports 20191003 1

Stacked atomically thin transition metal dichalcogenides (TMDs) exhibit fundamentally new physical properties compared to those of the individual layers. The twist angle between the layers plays a crucial role in tuning these properties. Having a tool that provides high-resolution, large area mapping of the twist angle, would be of great importance in the characterization of such 2D structures. Here we use polarization-resolved second harmonic generation (P-SHG) imaging microscopy to rapidly map  ...[more]

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