Ontology highlight
ABSTRACT:
SUBMITTER: Rivas NA
PROVIDER: S-EPMC6964857 | biostudies-literature | 2020
REPOSITORIES: biostudies-literature
Rivas Nicolás Alfonso NA Babayigit Aslihan A Conings Bert B Schwarz Torsten T Sturm Andreas A Garzón Manjón Alba A Cojocaru-Mirédin Oana O Gault Baptiste B Renner Frank Uwe FU
PloS one 20200116 1
Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chemical degradation caused by the beam of high-energy ions. These aspects are especially critical in highly-sensitive specimens. In this regard, ion beam milling under cryogenic conditions has been an es ...[more]