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Optical emission from focused ion beam milled halide perovskite device cross-sections.

ABSTRACT: Cross-sectional transmission electron microscopy has been widely used to investigate organic-inorganic hybrid halide perovskite-based optoelectronic devices. Electron-transparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium ions used in FIB milling may severely degrade the structure and composition of halide perovskites in the lamellae, potentially invalidating studies performed on them. In this work, the close relationship between perovskite structure and luminescence is exploited to examine the structural quality of perovskite solar cell lamellae prepared by FIB milling. Through hyperspectral cathodoluminescence (CL) mapping, the perovskite layer was found to remain optically active with a slightly blue-shifted luminescence. This finding indicates that the perovskite structure is largely preserved upon the lamella fabrication process although some surface amorphisation occurred. Further changes in CL due to electron beam irradiation were also recorded, confirming that electron dose management is essential in electron microscopy studies of carefully prepared halide perovskite-based device lamellae. RESEARCH HIGHLIGHTS: Cathodoluminescence is used to study the emission of focused ion beam milled perovskite solar cell lamellae. The perovskite remained optically active with a slightly blue-shifted luminescence, indicating that the perovskite structure is mostly preserved.

SUBMITTER: Kosasih FU

PROVIDER: S-EPMC9304233 | biostudies-literature | 2022 Jun

REPOSITORIES: biostudies-literature

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Optical emission from focused ion beam milled halide perovskite device cross-sections.

Kosasih Felix U FU Divitini Giorgio G Orri Jordi Ferrer JF Tennyson Elizabeth M EM Kusch Gunnar G Oliver Rachel A RA Stranks Samuel D SD Ducati Caterina C

Microscopy research and technique 20220203 6

Cross-sectional transmission electron microscopy has been widely used to investigate organic-inorganic hybrid halide perovskite-based optoelectronic devices. Electron-transparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium ions used in FIB milling may severely degrade the structure and composition of halide perovskites in the lamellae, potentially invalidating studies performed on them. In this work, the close relationsh ...[more]

PMID: 35118749

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Project description:A thorough procedure was developed to efficiently manufacture dogbone samples using focused ion beam (FIB) milling for micro-tensile testing. A Bruker PI 89 PicoIndenter, Billerica, MA, USA, was used as a case study, although the analysis and results are applicable to other micro-mechanical testing systems capable of mounting a standard, Ø12.7 mm × Ø3.2 mm pin, scanning electron microscopy (SEM) pin stub (Ted Pella, Redding, CA, USA). Nine dogbones were made from an Fe-45Cu alloy additively manufactured using powder-fed laser-directed energy deposition (DED-LB). Testing showed that fracture was confined to the gauge section for all dogbones and that the fracture mode, ductile vs. brittle, was entirely dependent on the grain orientation relative to the loading direction. The analysis showed that the measured plastic strain to failure can vary from >11% (optimal geometry) to <1% (non-optimal geometry) in micro-tensile testing of high-tensile-strength (>1 GPa) metallic materials. Subsequently, a finite element analysis (FEA) was conducted to identify the improved dogbone geometries. A total of ten thousand dogbone geometries were tested, and their dimensions were defined by a set of four adjustable parameters (corner radius, load surface angle, load surface length, and dogbone head length). The gauge width and gauge length were fixed to 4 µm and 10 µm, respectively. Three-dimensional surface plots of the stress concentration as a function of two parameters were used to identify the optimal ranges of parameter values. The addition of maximum width and length constraints, measuring 25 µm and 30 µm, respectively, allowed us to identify an optimal geometry at load surface angles of 30° and 45°. Their respective dimensions (corner radius, load surface length, and dogbone head length) are, in µm, 12, 6, and 7 and 10, 7, and 7. Testing these two optimal geometries with a range of gauge lengths from 4 to 20 µm showed that smaller gauge lengths only slightly reduced the detrimental stress concentration outside the gauge section. However, smaller gauge lengths will notably improve the FIB surface polishing step as tapering is reduced with smaller dogbone lengths.

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Optical emission from focused ion beam milled halide perovskite device cross-sections.

Publications

Optical emission from focused ion beam milled halide perovskite device cross-sections.

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